DELMIC B.V. is a company based in Delft, the Netherlands that produces correlative light and electron microscopy solutions. Currently, DELMIC produces three systems: the SECOM, a platform for integrated fluorescence and electron microscopy, the SPARC, a high-performance cathodoluminescence detection system, and the Delphi, the world's first fully integrated fluorescence and scanning electron microscope and the product of a collaboration with Phenom-World. These systems are also accompanied by ODEMIS, open-source software designed to navigate the integrated microscopy systems and to optimize image overlay.
DELMIC originated as a result of the development of the SECOM platform which was conceived by Charged Particle Optics group of Delft University of Technology. At the end of 2011 the company obtained the SPARC system from the Photonic Materials Group at AMOLF. At the International Microscopy Conference in 2014, DELMIC also launched the Delphi system. These three systems cater to a broad range of researchers in fields ranging from nanophotonics to cell biology.
As of 2016, DELMIC has expanded its product families to include the SPARC Compact, for researchers who specifically require intensity measurements by a photomultiplier tube, and the SECOM SR, an integrated CLEM system with a super-resolution optical microscope.
DELMIC’s aim is to continuously innovate in order to offer our customers integrated systems that offer superior performance and user friendliness.
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2015 Microscopy Today Innovation Award (Delphi)
2014 MRS Innovation in Materials Characterization Award
2013 Microscopy Today Innovation Award (SECOM)