Materials

Determine electronic and optical properties of materials at nanoscale

Understand fundamental physical and chemical processes that govern materials’ properties with cathodoluminescence imaging, which combines spectral sensitivity and high spatial resolution.

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What can we help you with?
  • Measure band edge emission down to the deep ultraviolet
  • Observing defect luminescence
  • Quantify concentration gradients
  • Understand, optimize, and monitor growth processes
  • Perform failure analysis
Hyperspectral cathodoluminescence of a nanorod

Investigate materials with cathodoluminescence (CL)

If you are studying ceramics, dielectrics, and (compound) semiconductors or develop devices and functional materials, such as scintillators, phosphors, high-power electronics light-emitting-diodes, diode lasers, and solar cells, you need solutions that can help you to efficiently analyze these materials. Cathodoluminescence emission can be used to explore many fundamental properties of matter.

It is a great technique for studying light transport, scattering, electronic structure of a material, resonant phenomena and much more. Learn more about your samples with powerful CL solutions, which will support your fundamental studies, quality control process or failure analysis.

Find out how we can help you in your specific field

What we can offer

Powerful and fast CL solutions
Powerful and fast solutions

Focus on studying your samples with the support of cathodoluminescence detectors

Experimental freedom with CL imaging modes
Experimental freedom

Perform various experiments and learn more about your materials with different imaging modes

High sensitivity and resolution data
High sensitivity and resolution

Analyze subtle changes in the output spectrum, emission lifetime, and more

Support of Delmic application experts
Support of our application experts

Get the most of your CL system with the help of our application experts

What results can I achieve with cathodoluminescence?

Cathodoluminescence imaging is a powerful technique for studying both bulk and nanostructured materials. Various imaging modes of our CL detectors allow you to collect intensity (cathodoluminescence intensity mapping) and visualize the full emission spectrum (with hyperspectral imaging). This can be beneficial for studying semiconductor materials to see the materials performance for LEDs for lighting and displays, for example. 

Hyperspectral CL data on a set of InGaN nanorods Hyperspectral CL data on a set of InGaN nanorods
Hyperspectral CL data on a set of InGaN nanorods. Images courtesy of Dr. S. Meuret (AMOLF). Also see S. Meuret et al. Ultramicroscopy 197, 28-38 (2019)
Dr. David Lindgren, Delmic customer

With the SPARC Compact system we did several hundred CL measurements per week and really managed to develop methods for quick analysis of the data.

Dr. David Lindgren

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Sol Voltaics

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Talk to an expert

Get in touch with our applications specialist Sangeetha to get more information.

Call +31 (0)15 744 01 58 or book a meeting on her agenda.

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Delmic applications specialist Sangeetha Hari