.svg "DELMIC")
@2x(1).png?width=132&height=36&name=Delmic_Black%2BBlue(preferred)@2x(1).png "Delmic_Black+Blue(preferred)@2x(1)"){kind=small}
.png)
Acquire more powerful insights to progress your research
Resolve optical properties at the nanoscale
Join the new standard
Understand the composition and formation of your geological material
Gain unique textural information about your geological sample
Understand the composition, history, and provenance of your rock
Study inter- and intra-granular features
Analyze image zonation and deformation features
.png?width=18&height=18&name=Arrow-iso-right(3).png){kind=icon}
Directly visualize the optical properties of nanophotonic structures
Map the radiative local density of optical states
list-checkCharacterizing guided and resonant optical modes
Measuring angular profiles to study directionality
Measuring the polarization of emission for multipolar analysis
Key advantages
Using the non-destructive and insightful cathodoluminescence technique
With our reliable and flexible solutions
With expert support from our application team
With our intuitive, open-source software ODEMIS
Our solutions
.png?width=18&height=18&name=Arrow-iso-right(1).png){kind=icon}
Ensures the best data quality
Tailored to your research needs
Future-proof and easily upgradeable
Rapidly obtain micro- and nanoscale insights
Efficiently screen your materials for further analysis
Easy integration and operation
Large area micro- and nanoscale analysis
Efficient and user-friendly workflow
Future-proof and easily upgradeable
Perform lifetime imaging and g(2) imaging
Get insights into intrinsic material properties, nanoscale quality, and defects
Study the quantum nature of light and single-photon emitters
Customers
“I ultimately chose Delmic because the Delmic system is modular: One can purchase and update the system incrementally.”
Prof. Nahid Talebi Kiel University
"The SPARC system is an elegant way to extend the microscopic analysis we perform using other methods."
Priv.-Doz. Dr. Daniel Abou-Ras Helmholtz-Zentrum Berlin
"The images have exceeded our expectations and the acquisition time is remarkably fast compared to CL systems I have used in the past. The large area mapping and stitching capabilities of the Delmic software is phenomenal."
Prof. Cameron Davidson Department of Geology, Carleton College
