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Effortless CL intensity detection
Use JOLT for rapid and convenient CL detection. Gain valuable insights into geological materials by mapping the emitted CL intensity to reveal properties such as crystal growth, zonation, deformation, and defect structures. Additionally, you can measure the CL emission of bulk materials such as semiconductors and rare-earth doped materials.
Advantages of JOLT
Rapidly obtain micro- and nanoscale insights
Efficiently screen your materials for further analysis
Easy integration and operation
Simultaneous acquisition with other (analytical) EM signals
Extremely large FOV (upto mm)
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