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Effortless CL intensity detection

Use JOLT for rapid and convenient CL detection. Gain valuable insights into geological materials by mapping the emitted CL intensity to reveal properties such as crystal growth, zonation, deformation, and defect structures. Additionally, you can measure the CL emission of bulk materials such as semiconductors and rare-earth doped materials.

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Advantages of JOLT

list-arrow Rapidly obtain micro- and nanoscale insights

list-arrow Efficiently screen your materials for further analysis

list-arrow Easy integration and operation

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Direct CL detection in your SEM

JOLT is an entry-level cathodoluminescence detector that offers two versions: a panchromatic detector and an RGB (colored CL) detector. It provides direct CL detection without any moving parts. Integration into your SEM couldn't be simpler as JOLT is compatible with all SEM brands and mounted on a single vacuum port.

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Combine with other techniques

To gain deeper insights into the properties of your sample, combine JOLT with other SEM-based techniques for correlative imaging, or use it as an effective screening tool for advanced characterization techniques such as mass spectrometry.

Imaging modes

Configured for CL intensity detection

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Fast-intensity imaging

list-check--neutral-dark The fastest and simplest method to obtain CL contrast

list-check--neutral-dark Fast scanning of large sample areas with high resolution

list-check--neutral-dark Identify regions of interest for more in-depth CL studies

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Imaging results

Imaging with JOLT

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Zircons

SEM and panchromatic CL intensity images for a set of zircon crystals. Scalebar: 150 μm Sample courtesy of Beijing Geoanalysis Co., Ltd. 

Zircons

SEM (top-left) and various CL intensity images of a zircon crystal. Sample courtesy of Beijing Geoanalysis Co., Ltd. 

Geology

SEM (left) and panchromatic CL intensity maps of YAG:Ce3+ phosphor micropowder. Scalebar: 50 μm. Sample courtesy of Prof. Xia

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Interested to learn more on CL imaging for zircons?
Read application note
Interested to learn more on CL imaging for zircons?
Read application note
Interested to learn more on CL intensity mapping?
Read technical note

Supporting the field

Company Logo - Zhengzhou University
Company Logo - Monash
Company Logo - BECThai
Company Logo - Emsis
Company Logo - China University of Geosciences
Company Logo - Hitachi Brazil
Company Logo - Amherst College
Company Logo - ETH Zurich
Company Logo - CNR NANOTec
Company Logo - Rome University
Company Logo - UCL
Company Logo - NewSpec
Company Logo - Zhejang University
Company Logo - Beijing Petrochemical Tec

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Reach out to our team of specialists to find out how our solutions can help you advance your research towards a next breakthrough.

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Application areas

What can JOLT do for your research?

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Geology
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Semiconductors

Insights

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Specifications sheet

Fast and flexible cathodoluminescence detection

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Image Thumbnail Application note CL ZirconsRES_380x215

Application note Geology

Cathodoluminescence for zircons

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Technical note Intensity mapping

Learn about the possibilities of cathodoluminescence intensity imaging mode

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Blog Category tag

How does Zircon Recrystallization Influence U-Pb Dating?

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Blog Software

ODEMIS: Delmic’s open-source microscopy software

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Interested to find a solution for your research?

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