Perform a variety of experiments using exchangeable optical modules
Cathodoluminescence solutions that reveal fundamental properties of matter
Fast EM solutions for reliable and high throughput electron microscopy
Integrated correlative microscopy solutions that combine the power of fluorescence and electron microscopy
Cathodoluminescence solutions that reveal fundamental properties of matter
Fast EM solutions for reliable and high throughput electron microscopy
Integrated correlative microscopy solutions that combine the power of fluorescence and electron microscopy
Use the power of the SPARC Compact CL detector to understand the structural composition and luminescence properties of your material at the nanoscale. Obtain valuable insights into processes such as crystal growth zonation in geological samples, or defect structures in semiconductor samples with high spatial resolution. Screen large areas of your sample quickly and acquire point-by-point panchromatic and monochromatic color-filtered images. Additionally, you can combine different monochromatic images for real- and false-color RGB CL imaging. After acquisition, you can easily visualize the (RGB) intensity data overlaid with the SEM image to perform quick and insightful data analysis.
SPARC Compact is a user-friendly, high-end CL intensity detector that includes color-filtering capabilities. It can quickly inspect large areas with its fast PMT detector and obtain high-quality CL intensity data thanks to the efficient parabolic mirror collection optic. SPARC Compact is also compatible with other SEM detection modalities such as BSE and EDS due to its retractable mirror stage. Additionally, the system is highly modular and can be extended to perform advanced CL imaging modes such as angle-resolved and hyperspectral CL imaging.
Perform a variety of experiments using exchangeable optical modules
Improve the efficiency of your materials analysis workflow by quickly inspecting large areas of your sample at the nanoscale
Easily retrofitted and compatible with SEMs from all the major brands
Visualize the (RGB) intensity data using the intuitive open-source software package ODEMIS
SPARC Compact system is a perfect tool if you work in the fields of geology and materials science: it can provide insights into such processes as crystal growth zonation, deformation, provenance, and defect structures, and more.
Don’t see your specific field?
Talk with our application specialistDr. David Lindgren
-Sol Voltaics