Complete materials analysis at the nanoscale
Use the SPARC Spectral CL detector to perform a comprehensive analysis of your material of interest and gain insights into its composition, crystal structure, optical modes, and electronic band gap. Detect trace elements and dopants, or improve the device/material efficiency through defect analysis at the nanoscale. Use up to six different CL imaging modes to meet your research needs, including fast-intensity imaging, angle-resolved imaging, and hyperspectral imaging. Additionally, you can perform time-resolved CL, providing further insight into dynamical material properties.