FAST-EM in action
FAST-EM was designed together with ThermoFisher, Technolution, and TU Delft to make complex EM workflows simple and efficient. The system uses optical Scanning Transmission Electron Microscopy (STEM) for image formation, for which the samples need to be collected on scintillators. The FAST-EM allows for the loading of up to nine scintillator substrates at the same time.
To achieve high-throughput imaging, FAST-EM uses 64 electron beams, which are scanned over the sample in parallel. The reliability of the microscope and the software allow the operator to leave the system running without constant supervision, allowing you to shift the focus from microscope operation to data analysis.