FAST-EM: ultra-fast automated multibeam electron microscope

To achieve high-throughput imaging, FAST-EM uses 64 electron beams.  These beams are scanned over the sample in parallel, and signals are recorded using a fast and highly sensitive Silicon Photo Multiplier (SiPM) array. This approach achieves significantly higher acquisition speeds. 

The FAST-EM system uses Scanning Electron Transmission Microscopy (STEM) for image formation. This is achieved by placing samples directly on a scintillator screen, which serves as the sample carrier. Scintillators produce localized cathodoluminescence when struck by electrons, which is captured using optical microscopy. 

The resulting light is then detected on the Silicon Photo Multiplier (SiPM) array, and processed to form the final gray-scale image. The unique detection setup can be used to still obtain excellent signal to noise ratios even at dwell times as short as 400 ns.

Projects for FAST-EM are easily created and managed using robust automation and easy-to-use software.

The reliability of the microscope and the software allow the operator to leave the system running without constant babysitting. 

One of the aspects of EM workflow that  introduces overhead into a project is sample exchange, which means that the operator has to supervise the system. FAST-EM allows loading of up to nine substrates at the same time, where each substrate can hold tens or even hundreds of sections. This allows for up to 72 hours of continuous imaging.