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Cathodoluminescence imaging for semiconductors

Use cathodoluminescence (CL) imaging to unveil the optoelectronic properties of semiconductors with nanoscale precision and wide spectral range from deep UV to IR. Benefit from this non-invasive technique with tunable electron penetration depth, allowing for depth-resolved studies and imaging of buried structures.

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list-arrow Probe local band edge emission and local defect band emission

list-arrow Analyze point defects and delocalized defects

list-arrow Image dopant distribution and carrier diffusion

list-arrow Measure damage and strain in the material

LEDs

Characterize LED light emissions

Perform CL imaging to study light emission characteristics of both miniaturized LED devices and bulk LED materials, including (Al,In)GaN, ZnO, and Perovskites InP/GaAs. Use spectroscopic insights for growth optimization, failure/defect analysis, or to check the (local) homogeneity in the optical response.

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list-check Gain insight into the (optical) properties

list-check Study the local geometry and internal material structure

list-check Acquire quantitatively comparable data

list-check Characterize LEDs from the deep UV to the infrared

Photovoltaic Materials

Probe light emissions of photovoltaic materials

Perform CL imaging on your photovoltaic (PV) semiconductor material for growth optimization, defect analysis, and (in)homogeneity analysis. Use CL for studying bulk, thin-film, or micro/nanostructured PV materials, particularly thin-film PV such as CdTe, CIGS, and GaAs as well as Perovskites, CZTS, and III/V nanowires.

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list-check Study local optical properties of systems

list-check Acquire quantitative and meaningful data

list-check Characterize PV materials from deep UV to IR

list-check Easily combine with other SEM techniques

Imaging modes

Find your ideal configuration

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Fast-intensity imaging

list-check--neutral-dark The fastest and simplest method to obtain CL contrast

list-check--neutral-dark Fast scanning of large sample areas with high resolution

list-check--neutral-dark Identify regions of interest for more in-depth CL studies

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Angle-resolved imaging

list-check--neutral-dark Understand more about the direction in which light is emitted

list-check--neutral-dark Observe the performance of antenna structures

list-check--neutral-dark Gain insight into the band structure of periodic systems

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Hyperspectral imaging

list-check--neutral-dark Gain insight into the wavelength distribution of CL emission

list-check--neutral-dark Obtain valuable information on the local optical and structural properties of the material

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Polarimetry and polarization filtered spectroscopy

list-check--neutral-dark Gain key insights into light-matter interactions of your material

list-check--neutral-dark Lock spurious background radiation and correct for aberrating effects in the collection optics

list-check--neutral-dark Combine with angle-resolved imaging for ideal studying of polarization effects

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Lens-scanning energy-momentum imaging

list-check--neutral-dark Combine "conventional" angle-resolved and hyperspectral CL imaging

list-check--neutral-dark Characterize optical properties of (nano)materials in energy and momentum space in great detail

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Our solutions

Find the perfect solution for your semiconductor research

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SPARC Spectral
JOLT
SPARC Compact
Time-resolved
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Comprehensive cathodoluminescence detection

Perform a comprehensive analysis of your material of interest at the nanoscale with the SPARC Spectral CL detector. Gain valuable insights into material composition, crystal structure, optical modes, and band gap energy. Detect trace elements and dopants, or improve the device/material efficiency through nanoscale defect analysis.

list-check Ensures the best data quality

list-check Tailored to your research needs

list-check Future-proof and easily upgradeable

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Fast and flexible cathodoluminescence detection

Use JOLT for rapid and convenient CL detection. Gain valuable insights into geological materials by mapping the emitted CL intensity to reveal properties such as crystal growth, zonation, deformation, and defect structures. Additionally, you can measure the CL emission of bulk materials such as semiconductors and rare-earth doped materials.

list-check Rapidly obtain micro- and nanoscale insights

list-check Efficiently screen your materials for further analysis

list-check Easy integration and operation

Interested to learn how JOLT can boost your research?
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Gain nanoscale insights into your materials

Use the power of the SPARC Compact CL detector to understand the structural composition and luminescence properties of your material at the nanoscale. Gain valuable insights into processes such as crystal growth zonation in geological samples or defect structures in semiconductor samples, all with exceptionally high spatial resolution.

list-check Large area micro- and nanoscale analysis

list-check Efficient and user-friendly workflow

list-check Future-proof and easily upgradeable

Interested to learn more about what SPARC Compact has to offer?
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Time-resolved cathodoluminescence imaging

Use time-resolved CL to unlock the decay trace and lifetime of your photon emitter. Additionally, you can conduct a comprehensive analysis of the photon distribution over time to gain detailed insights into your semiconductor or quantum material.

list-check Perform lifetime imaging and g(2) imaging

list-check Get insights into intrinsic material properties, nanoscale quality, and defects

list-check Study the quantum nature of light and single-photon emitters

list-check Pump-probe cathodoluminescence imaging

Interested to learn more about our time-resolved CL solution?
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Insights

All insights
Image Thumbnail Application note CL Imaging optical modesRES_380x215

Application note Optical modes

Imaging Optical Modes in Semiconductor Nanoparticles

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2023_CL_MicroLED Technology Image_Social Media

Blog MicroLEDs

MicroLED: The Next Revolution In Display Technology

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Blog Industry

More than Moore: the next steps for the semiconductor industry

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