Delmic offers several solutions that enable you to accelerate research into Type 1 diabetes. Correlative light and electron microscopy is perfect to combine functional and structural data, while Fast EM provides a high-throughput pipeline to image entire sections or compare samples.
Type 1 diabetes occurs when insulin-producing beta cells present in the islets of Langerhans in the pancreas, are attacked and destroyed. Electron microscopes (EM) allow the identification of subcellular features of the beta cells, providing insight in the disease process. Traditionally, EM has had the drawback that acquiring images with a good signal-to-noise ratio is time-consuming, especially for large regions like entire islets of Langerhans.
Delmic has developed two solutions that accelerate the use of EM in diabetes research. The first, integrated Correlative Light and Electron Microscopy (CLEM), combines FM and EM in one instrument, enabling the user to perform CLEM in a streamlined and automated manner. Integrated CLEM first rapidly images cells over a large field of view using FM, to identify the area of interest
based on cellular function, followed by selective high-resolution EM imaging at that location. In this way, both functional and structural data is acquired in a seamless manner.
A second solution, Fast EM, harnesses the increased throughput of a multibeam scanning EM to rapidly visualize large regions, at nanoscale resolution. High-throughput imaging enables comparative studies, where multiple samples need to be imaged and compared between healthy and diseased conditions. Fast EM also enables a bias-free method of recording data: samples are imaged in their entirety, rather than specific parts relevant only to the research question. In addition, the high throughput of FAST-EM enables rapid 3D visualization of pancreatic tissue, with which the pathophysiological processes can be examined in three dimensions.
Integrated CLEM combines the two imaging methods EM and FM, to offer a powerful streamlined and automated acquisition of high resolution CLEM images in the SEM. The platform is a retrofit compatible with SEM’s from the entire range of manufacturers.
Fast EM is a system dedicated to high throughput EM. The system’s speed and automation provide a stable workflow that requires minimal operator interaction.
Get in touch with our applications specialist Job to get more information.
Call +31 (0)15 744 01 58 or book a meeting on his agenda.
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SPARC Compact
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