Modify the SPARC system in a matter of minutes with exchangeable modules, gratings, and mirrors
Cathodoluminescence solutions that reveal fundamental properties of matter
Fast EM solutions for reliable and high throughput electron microscopy
Integrated correlative microscopy solutions that combine the power of fluorescence and electron microscopy
Cathodoluminescence solutions that reveal fundamental properties of matter
Fast EM solutions for reliable and high throughput electron microscopy
Integrated correlative microscopy solutions that combine the power of fluorescence and electron microscopy
Use the SPARC Spectral CL detector to perform a comprehensive analysis of your material of interest and gain insights into its composition, crystal structure, optical modes, and electronic band gap. Detect trace elements and dopants, or improve the device/material efficiency through defect analysis at the nanoscale. Use up to six different CL imaging modes to meet your research needs, including fast-intensity imaging, angle-resolved imaging, and hyperspectral imaging. Additionally, you can perform time-resolved CL, providing further insight into dynamical material properties.
The SPARC Spectral system is the most flexible and high-performance CL system on the market. The best data quality is ensured with its broad spectral range, unsurpassed sensitivity, and a high-quality parabolic mirror. Furthermore, it can be customized according to your research needs due to its modularity. The system is compatible with SEMs from all the major brands. The hardware’s functionality can be easily extended with current and future add-ons, while the free open-source software ensures constant access to updates, new features and scripting.
Modify the SPARC system in a matter of minutes with exchangeable modules, gratings, and mirrors
Obtain the best-quality CL data for powerful insights into your material
Easily retrofitted and compatible with SEMs from all the major brands
Painless and easy data acquisition with the free open-source software ODEMIS
The SPARC Spectral system provides valuable information about your materials, complementary to other analytical techniques. It is successfully used by companies and research institutes worldwide in the fields of geology, semiconductor analysis, materials science, and nanophotonics. Check each application field to read about specific case studies.
Don’t see your specific field?
Talk with our applications specialistDr. Daniel Abou-Ras
-Helmholtz-Zentrum Berlin